IMC20

Cette année la nouvelle édition de la conférence internationale de microscopie (IMC) se tiendra à Busan en Corée du 10 au 15 septembre 2023.

Venez découvrir les nouveautés JEOL sur notre stand.

Programme

lundi 11 septembre

10h30 – 11h	KS Han	Introducing a Schottky FE-SEM with high operability and a windowless EDS covering all KV range
12h30 – 13h	Movie style	Chemical state analysis of Si negative electrode  in a charged state using SEM-SXES
13h – 13h30	Yuhei Nakajima	Introduction of JEOL NEW FIB-SEM JIB-PS500i
15h30 – 16h	Noriaki Endo	Cutting-edge Technologies of Semiconductor Automated TEM/STEM System ”JEM-ACE200F”

mardi 12 septembre

10h30 – 11h	Movie style	Chemical state analysis of Si negative electrode  in a charged state using SEM-SXES
12h30 – 13h	Eiji Okunishi	Introduction of integrated analytical platform ”FEMTUS »
13h – 13h30	KAIST Professor Ji-Joon Song	A journey of Cryo-EMing in Korea
15h30 – 16h	Yuhei Nakajima	Introduction of JEOL NEW FIB-SEM JIB-PS500i

mercredi 13 septembre

10h30 – 11h	KS Han	Introducing a Schottky FE-SEM with high operability and a windowless EDS that covers all KV range
12h30 – 13h	Hiroki Hashiguchi	Introduction of New Observational and Analytical Methods with the Latest Attachments
13h – 13h30	The University of Tokyo Professor Naoya Shibata	MARS -Exploration of the Nanomagnetic World-
15h30 – 16h	Yuhei Nakajima	Introduction of JEOL NEW FIB-SEM JIB-PS500i

jeudi 14 septembre

10h30 – 11h	Movie style	Chemical state analysis of Si negative electrode  in a charged state using SEM-SXES
12h30 – 13h	KS Han	Introducing a Schottky FE-SEM with high operability and a windowless EDS covering all KV range
13h – 13h30	Yuhei Nakajima	Introduction of JEOL NEW FIB-SEM JIB-PS500i

Tous les jours

12h30 – 13h30

démonstration à distance

JEM-ACE200F High Throughput Analytical Electron Microscope