Welcome to our workshop on the Soft X-Ray Emission Spectrometer (SXES) System! Discover how this advanced technology provides precise insights into the chemical bonding state and electronic structure of materials.
Learn more about the applications and talk directly to the developers and users to clarify your questions and advance your research.
What is SXES:
The Soft X-Ray Emission Spectrometer (SXES) is a high energy-resolution spectrometer consisting of a specially designed diffraction grating and a high-sensitivity 2D detector (CCD camera).
In the same way as EDS, parallel detection is possible, and 0.3 eV (Fermi-edge, Al L-emission) high energy-resolution analysis can be performed, surpassing the energy resolution of WDS.
The SXE spectrometer optical system design enables simultaneous measurement of spectra with different energies. With the high energy-resolution, chemical state analysis mapping can be performed.
Schedule:
15.05.2025
13:00-18:00 o’clock (6 Talks)
19:00-22:00 Conference Dinner
16.05.2025
09:00-11:00 clock (3 Talks)
| Please register by sending email at vip@jeol.fr |
