Présentation

Les microsondes (EPMA) sont des outils indispensables pour la recherche, le développement et le contrôle de qualité dans de nombreux domaines de l’industrie, comme les aciers, l’automobile, les composants électroniques et les matériaux de batteries. Les microsondes sont aussi utilisées en science de la Terre et science des matériaux, comme la recherche sur les énergies fossiles et sur de nouveaux matériaux, contribuant ainsi à diverses recherches de pointe. Les utilisateurs de microsondes ont besoin d’acquérir des analyses simples rapidement et facilement, tout en gardant une très bonne analyse d’éléments traces dans des zones définies.

Pour répondre à ces demandes, JXA-iHP200F et JXA-iSP100 permettent de passer directement de l’observation par images optiques et électroniques à l’analyse avec dispersion de longueur d’ondes (WDS), spectroscopie de rayons X à dispersion d’énergie (EDS), cathodoluminescence (CL), et bien d’autres techniques.

JXA-iHP200F correspond à la source FEG et JXA-iSP100 à la source tungstène.

Haut rendement

N’importe quel utilisateur peut effectuer une opération en continu, depuis l’insertion d’un échantillon jusqu’à la détermination d’une zone d’analyse avec une précision extrême.

Analyse de haute précision

Le système de microsonde (EPMA) intégré permet d’acquérir des données d’analyse plus rapidement et plus facilement avec exactitude et précision.

Maintenance facile

Comme la maintenance est automatiquement effectuée quand cela est nécessaire, tout utilisateur peut maintenir le système de microsonde dans ses conditions d’utilisation optimales.

Les microsondes JXA-iHP200F et JXA-iSP100 sont très évolutives. Il est possible d’intégrer non seulement des spectromètres WDS et EDS mais aussi un spectromètre SXES pour l’analyse de l’état chimique, un système de diffraction d’électrons rétrodiffusés (EBSD) pour l’analyse de l’orientation des cristaux et des détecteurs de cathodoluminescence et cela pour une grande variété d’applications.

Caractéristiques

réglage microsonde EPMA

Réglage
Insertion de l’échantillon avec chargement automatique !
La zone d’observation est rapidement trouvée
L’insertion de l’échantillon et l’acquisition d’une image optique (étape image de navigation) sont exécutées en un simple clic.
La zone d’analyse peut être sélectionnée à l’étape image de navigation.

analyse élémentaire

Analyse
Fonctions automatiques permettant d’obtenir des images MEB en haute définition.
Analyse élémentaire rapide avec un réglage simplifié de la microsonde.

En combinant la fonction de mise au point automatique d’un microscope optique et les fonctions automatiques d’un microscope électronique à balayage intégrant un nouveau système avec une plus grande précision et un degré de capacité plus rapide, n’importe quel utilisateur peut acquérir des images MEB en haute définition.

Live Analyse permet un contrôle par écran pendant l’observation.
La fonction « Easy EPMA » est disponible pour que les utilisateurs novices puissent facilement utiliser la microsonde.
L’utilisation est encore améliorée avec l’intégration d’images MEB, EDS, WDS et optiques.

étalonnage efficace

Maintenance aisée
Étalonnage efficace avec 18 échantillons standards intégrés.

La nouvelle fonction d’étalonnage réduit les étapes d’étalonnage périodique et supprime les erreurs de fonctionnement en utilisant des échantillons standards intégrés.
Plus grande efficacité grâce à l’étalonnage automatique la nuit.
La fonction de notification de maintenance assure une maintenance correcte au moment voulu.

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‌‌Celebration of Dr. Hideyuki Takahashi (JEOL), recipient of the Presidential Science Award from the Microanalysis Society (MAS) for his long-term contribution to the field of microbeam analysis.
Introduction by Vern Robertson (JEOL). Special presentation by Anette von der Handt, University of Minnesota. “Adventures at low kV: exploring new limits of electron probe microanalysis with the SXES”.

GALERIE

JXA-iHP200F

JXA-iSP100